Reliability-series |
Compliances:
GJB548 standard (corresponding to
MIL-STD-883)
GJB597 standard (corresponding to MIL-M-38510)
Applications:
high temperature dynamic burn-in test for kinds
of super large scale IC
such as DSP, FPGA or CPLD.
Specifications:
|
Model |
ELEA-VL |
|
Zone |
8区(标准) |
|
Test capacity |
2×16区 |
|
Test temperature |
最高150℃ |
|
Digital signal |
96路独立的高速数字信号发生单元,最高频率可达10MHz,各通道可独立定义为输入/输出属性;信号上升、下降沿时间小于10ns(100pf容性负载);
|
|
Analog signal |
单路多种类模拟信号发生单元及驱动电路,最高频率可达1MHz |
|
Working feature |
基于JTAG的边界扫描单元电路具有老化测试程序自由加载、内部逻辑功能和I/O管脚充分监测的能力。统针对各种DSP、FPGA老化器件提供了代码覆盖较高的老化测试程序,实现了真正意义上的边老化边测试(TDBI); |
|
BaudRate |
500K |
|
Secondary power |
四路独立的高动态响应二级电源模块,最低电压可输出1V; |
|
Power |
输入:AC380V,50Hz,三相(220V单相可选);整机功率:4kW以下 |
|
Weight |
约500kg |
 |
|