 Reliability-series |
 Compliances:
GJB128 standard (corresponding to MIL-STD-750)
Applications:
High temperature reverse bias (HTRB, HTIR) test
for diodes, triodes,
MOSFET and controllable silicon.
Specifications:
|
Model |
DEVR-V |
|
Zone |
16区 |
|
Test capacity |
80×16 |
|
Test temperature |
最高150℃ |
|
Burn-in power |
100V、300V、600V、1200V、1500V、2000V等规格任选；可配置2～8路，标准配置4路 |
|
Ir |
Range |
1.0μA～50.0ｍA |
|
Error |
±1.0%RD±2LSB |
|
Resolution |
0.1μA |
|
Vtest |
Range |
0～2000.0V |
|
Error |
±0.5%RD±2.0V |
|
Resolution |
0.1V(检测电压≤1000V)；1V(检测电压≥1000V) |
|
Working feature |
老化试验前和老化结束后可进行PN结正向电压检测,对失效器件进行判断;设备内部提供电源转换接口,通过插拔转换的方式实现任何一台电源均可以为16个区提供试验电压. |
|
Power |
输入：AC220V,50Hz；整机功率：4kW以下 |
|
Weight |
约400kg |
|
Size |
1313mm×1950mm×1350mm |
|
|
